Surface Potential of Graphene Oxide Investigated by Kelvin Probe Force Microscopy

Author： Li Jun Qi Xiang Hao Guolin Huang Kai Zhong Jianxin

E-ISSN： 1536-4046|23|9|777-781

ISSN： 1536-383X

Source： Fullerenes, Nanotubes and Carbon Nanostructures, Vol.23, Iss.9, 2015-09, pp. : 777-781

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

Label-free detection of the aptamer binding on protein patterns using Kelvin probe force microscopy (KPFM)

By Gao Pei

Analytical and Bioanalytical Chemistry, Vol. 394, Iss. 1, 2009-05 ,pp. : 207-214

Springer Publishing Company

Access to resources Recommend Favorite

Stressed Corrosion of an Austenitic Stainless Steel Studied by Scanning Kelvin Probe Force Microscopy

By Pan Tongyan

Analytical Letters, Vol. 45, Iss. 17, 2012-11 ,pp. : 2580-2588

Taylor & Francis Ltd

Access to resources Recommend Favorite

Nanoscale Lithography Mediated by Surface Self-Assembly of 16-[3,5-Bis(Mercaptomethyl)phenoxy]hexadecanoic Acid on Au(111) Investigated by Scanning Probe Microscopy

By Zhai Xianglin Lee Han Ju Tian Tian Lee T. Randall Garno Jayne C.

Molecules, Vol. 19, Iss. 9, 2014-08 ,pp. : 13010-13026

MDPI

Access to resources Recommend Favorite

A Kelvin probe force microscopic study of the local dopant distribution in conducting polybithiophene

By Semenikhin O.A. Jiang L. Iyoda T. Hashimoto K. Fujishima A.

Electrochimica Acta, Vol. 42, Iss. 20, 1997-01 ,pp. : 3321-3326

Elsevier

Access to resources Recommend Favorite

Epitaxial Graphene and Graphene–Based Devices Studied by Electrical Scanning Probe Microscopy

By Kazakova Olga Panchal Vishal Burnett Tim L.

Crystals, Vol. 3, Iss. 1, 2013-03 ,pp. : 191-233

MDPI

Access to resources Recommend Favorite