Publisher: Bentham Science Publishers
E-ISSN: 2213-1132|3|1|66-76
ISSN: 2213-1116
Source: Recent Patents on Electrical & Electronic Engineering (Formerly Recent Patents on Electrical Engineering), Vol.3, Iss.1, 2010-01, pp. : 66-76
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
By Yakimov V.
Measurement Techniques, Vol. 48, Iss. 12, 2005-12 ,pp. :
Insight - Non-Destructive Testing and Condition Monitoring, Vol. 49, Iss. 10, 2007-10 ,pp. :
By Chen Hanxin Shang Yunfei Sun Kui
Insight - Non-Destructive Testing and Condition Monitoring, Vol. 55, Iss. 2, 2013-02 ,pp. :