Characterizing silicon intercalated graphene grown epitaxially on Ir films by atomic force microscopy

Author： Yong Zhang Ye-Liang Wang Yan-De Que Hong-Jun Gao

E-ISSN： 1741-4199|24|7|78104-78107

ISSN： 1674-1056

Source： Chinese Physics B, Vol.24, Iss.7, 2015-07, pp. : 78104-78107

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