Effect of body biasing on single-event induced charge collection in deep N-well technology

Author： Yi Ding   Jian-Guo Hu   Jun-Rui Qin   Hong-Zhou Tan  

Publisher： IOP Publishing

E-ISSN： 1741-4199|24|7|79401-79405

ISSN： 1674-1056

Source： Chinese Physics B, Vol.24, Iss.7, 2015-07, pp. : 79401-79405

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