Identifying single electron charge sensor events using wavelet edge detection

Author: Prance J R   Van Bael B J   Simmons C B   Savage D E   Lagally M G   Friesen Mark   Coppersmith S N   Eriksson M A  

Publisher: IOP Publishing

E-ISSN: 1361-6528|26|21|215201-215206

ISSN: 0957-4484

Source: Nanotechnology, Vol.26, Iss.21, 2015-05, pp. : 215201-215206

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Abstract