New Method for Exposure Threshold Measurement of Laser Thermal Imaging Materials

By Hare David E.   Rhea Stuart T.   Dlott Dana D.  

Journal of Imaging Science and Technology, Vol. 41, Iss. 6, 1997-11 ,pp. : 588-593

Society for Imaging Science and Technology

Access to resources Recommend Favorite

Estimation of Thermal Conductivity of Amorphous Silicon Thin Films from the Optical Reflectivity Measurement

By Moon Seung-Jae   Choi Jung Hyun  

Journal of Nanoscience and Nanotechnology, Vol. 13, Iss. 9, 2013-09 ,pp. : 6362-6366

American Scientific Publishers

Access to resources Recommend Favorite

Thin film silicon substrate formation using electrochemical anodic etching method

By Kwon J.-H.   Lee S.-H.   Ju B.-K.  

Surface Engineering, Vol. 25, Iss. 8, 2009-11 ,pp. : 603-605

Maney Publishing

Access to resources Recommend Favorite

Investigation on the thermal conductivity of AlN thin films by using Molecular Dynamics simulation

By Ping Yang   Shen Min   Liao Ningbo  

International Journal of Materials and Product Technology, Vol. 34, Iss. 3, 2009-04 ,pp. : 323-329

Inderscience Publishers

Access to resources Recommend Favorite

A method for determining the thermal EMF and thermal conductivity

By Edgorova D.   Dzhakhanov S.   Karimov A.   Kuliev Sh.  

Instruments and Experimental Techniques, Vol. 49, Iss. 3, 2006-05 ,pp. : 435-437

MAIK Nauka/Interperiodica

Access to resources Recommend Favorite