Corrigendum: Calibrated complex impedance and permittivity measurements with scanning microwave microscopy (2014 Nanotechnology 25 145703)

Author： Gramse G   Kasper M   Fumagalli L   Gomila G   Hinterdorfer P   Kienberger F  

Publisher： IOP Publishing

E-ISSN： 1361-6528|26|14|149501-149501

ISSN： 0957-4484

Source： Nanotechnology, Vol.26, Iss.14, 2015-04, pp. : 149501-149501

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