Accurate measurement and influence on device reliability of defect density of a light-emitting diode

Author: Zu-Qiang Guo   Ke-Yuan Qian  

Publisher: IOP Publishing

E-ISSN: 1741-4199|22|10|106108-106112

ISSN: 1674-1056

Source: Chinese Physics B, Vol.22, Iss.10, 2013-10, pp. : 106108-106112

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract