Strain induced irreversible critical current degradation in highly dense Bi-2212 round wire

Author: Bjoerstad R   Scheuerlein C   Rikel M O   Ballarino A   Bottura L   Jiang J   Matras M   Sugano M   Hudspeth J   Michiel M Di  

Publisher: IOP Publishing

E-ISSN: 1361-6668|28|6|62002-62009

ISSN: 0953-2048

Source: Superconductor Science and Technology, Vol.28, Iss.6, 2015-06, pp. : 62002-62009

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