Analysis of secondary electron emission for conducting materials using 4-grid LEED/AES optics

Author: Patino M I   Raitses Y   Koel B E   Wirz R E  

Publisher: IOP Publishing

E-ISSN: 1361-6463|48|19|195204-195213

ISSN: 0022-3727

Source: Journal of Physics D: Applied Physics, Vol.48, Iss.19, 2015-03, pp. : 195204-195213

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Abstract