Direct comparison of AFM and SEM measurements on the same set of nanoparticles

Author： Delvallée A   Feltin N   Ducourtieux S   Trabelsi M   Hochepied J F  

Publisher： IOP Publishing

E-ISSN： 1361-6501|26|8|85601-85615

ISSN： 0957-0233

Source： Measurement Science and Technology, Vol.26, Iss.8, 2015-08, pp. : 85601-85615

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