Low temperature scanning force microscopy using piezoresistive cantilevers

Author： Meiser P   Koblischka M R   Hartmann U  

Publisher： IOP Publishing

E-ISSN： 1361-6501|26|8|85903-85909

ISSN： 0957-0233

Source： Measurement Science and Technology, Vol.26, Iss.8, 2015-08, pp. : 85903-85909

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