Simulation of channel orientation dependent transport in ultra-scaled monolayer MoX2 (X = S, Se, Te) n-MOSFETs

Author: Chang Jiwon  

Publisher: IOP Publishing

E-ISSN: 1361-6463|48|14|145101-145106

ISSN: 0022-3727

Source: Journal of Physics D: Applied Physics, Vol.48, Iss.14, 2015-04, pp. : 145101-145106

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Abstract