Author: Chang Po-Han Kuo Chih-Yu Chern Ruey-Lin
Publisher: IOP Publishing
E-ISSN: 1361-6463|48|29|295103-295110
ISSN: 0022-3727
Source: Journal of Physics D: Applied Physics, Vol.48, Iss.29, 2015-07, pp. : 295103-295110
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Electron paths and double-slit interference in the scanning gate microscopy
New Journal of Physics, Vol. 17, Iss. 6, 2015-06 ,pp. :