Temperature dependent electron effective mass and barrier height in HfO2 based metal/oxide/metal devices

Author: Kamel F El  

Publisher: IOP Publishing

E-ISSN: 1361-6463|48|28|285304-285308

ISSN: 0022-3727

Source: Journal of Physics D: Applied Physics, Vol.48, Iss.28, 2015-07, pp. : 285304-285308

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Abstract