Quantifying the quantum gate fidelity of single-atom spin qubits in silicon by randomized benchmarking

Author： Muhonen J T   Laucht A   Simmons S   Dehollain J P   Kalra R   Hudson F E   Freer S   Itoh K M   Jamieson D N   McCallum J C   Dzurak A S   Morello A  

Publisher： IOP Publishing

E-ISSN： 1361-648X|27|15|154205-154212

ISSN： 0953-8984

Source： Journal of Physics: Condensed Matter, Vol.27, Iss.15, 2015-04, pp. : 154205-154212

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