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Author: Demetrashvili Nino Van den Heuvel Edwin R.
Publisher: Wiley-Blackwell
E-ISSN: 1541-0420|71|2|548-555
ISSN: 0006-341X
Source: Biometrics, Vol.71, Iss.2, 2015-06, pp. : 548-555
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Abstract
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