Sensitivity analysis and variance reduction in a stochastic non-destructive testing problem

Author: De Staelen R.H.   Beddek K.  

Publisher: Taylor & Francis Ltd

E-ISSN: 1029-0265|92|9|1874-1882

ISSN: 0020-7160

Source: International Journal of Computer Mathematics, Vol.92, Iss.9, 2015-09, pp. : 1874-1882

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Abstract