Exploring the properties of MTO4 compounds using high‐pressure powder x‐ray diffraction

E-ISSN： 1521-4079|50|9-10|729-736

ISSN： 0232-1300

Source： CRYSTAL RESEARCH AND TECHNOLOGY (ELECTRONIC), Vol.50, Iss.9-10, 2015-09, pp. : 729-736

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

High-pressure synchrotron X-ray powder diffraction studies of zeolites

By Hriljac Joseph A.

Crystallography Reviews, Vol. 12, Iss. 2, 2006-04 ,pp. : 181-193

Taylor & Francis Ltd

Access to resources Recommend Favorite

Study of partial melting at high-pressure using in situ X-ray diffraction

By Andrault D. Morard G. Bolfan-Casanova N. Ohtaka O. Fukui H. Arima H. Guignot N. Funakoshi K. Lazor P. Mezouar M.

International Journal of High Pressure Research, Vol. 26, Iss. 3, 2006-09 ,pp. : 267-276

Taylor & Francis Ltd

Access to resources Recommend Favorite

High-pressure powder X-ray diffraction study of Cu 5 Si and pressure-driven isostructural phase transition

By Li C.Y.

Philosophical Magazine Letters, Vol. 93, Iss. 2, 2013-02 ,pp. : 85-92

Taylor & Francis Ltd

Access to resources Recommend Favorite

High-pressure and high-temperature X-ray diffraction studies of scheelite BaWO4

By Lacomba-Perales R. Martinez-Garcia D. Errandonea D. Le Godec Y. Philippe J. Morard G.

International Journal of High Pressure Research, Vol. 29, Iss. 1, 2009-03 ,pp. : 76-82

Taylor & Francis Ltd

Access to resources Recommend Favorite

High-pressure X-ray diffraction study of UMn 2 Ge 2

By Siruguri V. Paranjpe S.K. Raj P. Sathyamoorthy A. Itie J.-P. Polian A.

Physica B, Vol. 344, Iss. 1, 2004-02 ,pp. : 255-259

Elsevier

Access to resources Recommend Favorite