Publisher: John Wiley & Sons Inc
E-ISSN: 1365-2818|259|3|165-172
ISSN: 0022-2720
Source: JOURNAL OF MICROSCOPY, Vol.259, Iss.3, 2015-09, pp. : 165-172
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
By Yasuhara Akira Hiraga Kenji
Philosophical Magazine, Vol. 95, Iss. 14, 2015-05 ,pp. :
By Yasuhara Akira Yubuta Kunio Hiraga Kenji
Philosophical Magazine Letters, Vol. 94, Iss. 9, 2014-09 ,pp. :
Atomic-resolution spectroscopic imaging of oxide interfaces
Philosophical Magazine, Vol. 90, Iss. 35-36, 2010-12 ,pp. :
Applications of the Oxford-JEOL aberration-corrected electron microscope
By Nellist P. D. Kirkland A. I.
Philosophical Magazine, Vol. 90, Iss. 35-36, 2010-12 ,pp. :