Origin of Projected Excellent Thermoelectric Transport Properties in d0‐Electron AMN2 (A = Sr or Ba; M = Ti, Zr, Hf) Layered Complex Metal Nitrides

Publisher： John Wiley & Sons Inc

E-ISSN： 1099-0682|2015|22|3715-3722

ISSN： 1434-1948

Source： EUROPEAN JOURNAL OF INORGANIC CHEMISTRY (ELECTRONIC), Vol.2015, Iss.22, 2015-08, pp. : 3715-3722

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