Dimensional metrology of lab‐on‐a‐chip internal structures: a comparison of optical coherence tomography with confocal fluorescence microscopy

Publisher: John Wiley & Sons Inc

E-ISSN: 1365-2818|259|1|26-35

ISSN: 0022-2720

Source: JOURNAL OF MICROSCOPY, Vol.259, Iss.1, 2015-07, pp. : 26-35

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Abstract