Publisher: John Wiley & Sons Inc
E-ISSN: 1365-2818|259|2|137-142
ISSN: 0022-2720
Source: JOURNAL OF MICROSCOPY, Vol.259, Iss.2, 2015-08, pp. : 137-142
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Correction of image drift and distortion in a scanning electron microscopy
JOURNAL OF MICROSCOPY, Vol. 260, Iss. 3, 2015-12 ,pp. :
On the role of electron–ion recombination in low vacuum scanning electron microscopy
JOURNAL OF MICROSCOPY, Vol. 205, Iss. 1, 2002-01 ,pp. :