Analysis of leaf surfaces using scanning ion conductance microscopy

Publisher: John Wiley & Sons Inc

E-ISSN: 1365-2818|258|2|119-126

ISSN: 0022-2720

Source: JOURNAL OF MICROSCOPY, Vol.258, Iss.2, 2015-05, pp. : 119-126

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

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Abstract