Electrospray droplet impact/secondary ion mass spectrometry (EDI/SIMS) using NaF and AgF as cationization matrices

Publisher: John Wiley & Sons Inc

E-ISSN: 1096-9918|47|8|832-837

ISSN: 0142-2421

Source: SURFACE AND INTERFACE ANALYSIS, Vol.47, Iss.8, 2015-08, pp. : 832-837

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract