The structure of two‐layered objects reconstructed using EDXRF‐analysis and internal X‐ray ratios

Publisher: John Wiley & Sons Inc

E-ISSN: 1097-4539|44|4|233-238

ISSN: 0049-8246

Source: X-RAY SPECTROMETRY, Vol.44, Iss.4, 2015-07, pp. : 233-238

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Abstract