High‐lateral resolution X‐ray fluorescence microspectroscopy and dynamic mathematical modelling as tools for the study of electrodeposited electrocatalysts

Publisher： John Wiley & Sons Inc

E-ISSN： 1097-4539|44|4|263-275

ISSN： 0049-8246

Source： X-RAY SPECTROMETRY, Vol.44, Iss.4, 2015-07, pp. : 263-275

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