Reasonable Diffraction Data from “Bad” Crystals: Structure Elucidation of Ge3Sb2Te5Se and (GeTe)2.38(Sb2Te3)(Sb2)1.23 Using Microfocused Synchrotron Beams

Publisher: John Wiley & Sons Inc

E-ISSN: 1521-3749|641|6|1024-1030

ISSN: 0044-2313

Source: ZAAC-JOURNAL OF INORGANIC AND GENERAL CHEMISTRY (ELECTRONIC), Vol.641, Iss.6, 2015-05, pp. : 1024-1030

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Abstract