Special issue on testing, analysis and debugging of concurrent programs

Publisher： John Wiley & Sons Inc

E-ISSN： 1099-1689|25|3|165-166

ISSN： 0960-0833

Source： SOFTWARE TESTING, VERIFICATION & RELIABILITY (ELECTRONIC), Vol.25, Iss.3, 2015-05, pp. : 165-166

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

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