Analysis of dynamic cantilever behavior in tapping mode atomic force microscopy

Publisher： John Wiley & Sons Inc

E-ISSN： 1097-0029|1059-910X|10|935-946

ISSN： 1059-910x

Source： MICROSCOPY RESEARCH AND TECHNIQUE, Vol.1059-910X, Iss.10, 2015-10, pp. : 935-946

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