Bayesian Network Model with Application to Smart Power Semiconductor Lifetime Data

Publisher： John Wiley & Sons Inc

E-ISSN： 1539-6924|272-4332|9|1623-1639

ISSN： 0272-4332

Source： RISK ANALYSIS, Vol.272-4332, Iss.9, 2015-09, pp. : 1623-1639

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