Dielectrophoretic positioning of single nanoparticles on atomic force microscope tips for tip‐enhanced Raman spectroscopy
Publisher: John Wiley & Sons Inc
E-ISSN: 1522-2683|36|9-10|1142-1148
ISSN: 0173-0835
Source: ELECTROPHORESIS, Vol.36, Iss.9-10, 2015-05, pp. : 1142-1148
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Abstract