Persistent topology for cryo‐EM data analysis

Publisher: John Wiley & Sons Inc

E-ISSN: 2040-7947|31|8|n/a-n/a

ISSN: 2040-7939

Source: INTERNATIONAL JOURNAL FOR NUMERICAL METHODS IN BIOMEDICAL ENGINEERING (ELECTRONIC), Vol.31, Iss.8, 2015-08, pp. : n/a-n/a

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Abstract