Focus characterization at an X‐ray free‐electron laser by coherent scattering and speckle analysis

Publisher: John Wiley & Sons Inc

E-ISSN: 1600-5775|22|3|599-605

ISSN: 0909-0495

Source: JOURNAL OF SYNCHROTRON RADIATION (ELECTRONIC), Vol.22, Iss.3, 2015-05, pp. : 599-605

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Abstract