Dual‐energy X‐ray analysis using synchrotron computed tomography at 35 and 60 keV for the estimation of photon interaction coefficients describing attenuation and energy absorption

Publisher： John Wiley & Sons Inc

E-ISSN： 1600-5775|22|3|807-818

ISSN： 0909-0495

Source： JOURNAL OF SYNCHROTRON RADIATION (ELECTRONIC), Vol.22, Iss.3, 2015-05, pp. : 807-818

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