Two‐dimensional in situ metrology of X‐ray mirrors using the speckle scanning technique

E-ISSN： 1600-5775|22|4|925-929

ISSN： 0909-0495

Source： JOURNAL OF SYNCHROTRON RADIATION (ELECTRONIC), Vol.22, Iss.4, 2015-07, pp. : 925-929

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

Development of a speckle‐based portable device for in situ metrology of synchrotron X‐ray mirrors

JOURNAL OF SYNCHROTRON RADIATION (ELECTRONIC), Vol. 23, Iss. 5, 2016-09 ,pp. : 1131-1136

John Wiley & Sons Inc

Access to resources Recommend Favorite

X‐ray pulse wavefront metrology using speckle tracking

JOURNAL OF SYNCHROTRON RADIATION (ELECTRONIC), Vol. 22, Iss. 4, 2015-07 ,pp. : 886-894

John Wiley & Sons Inc

Access to resources Recommend Favorite

Towards a microchannel‐based X‐ray detector with two‐dimensional spatial and time resolution and high dynamic range

JOURNAL OF SYNCHROTRON RADIATION (ELECTRONIC), Vol. 22, Iss. 5, 2015-09 ,pp. : 1202-1206

John Wiley & Sons Inc

Access to resources Recommend Favorite

Focusing X‐ray free‐electron laser pulses using Kirkpatrick–Baez mirrors at the NCI hutch of the PAL‐XFEL

JOURNAL OF SYNCHROTRON RADIATION (ELECTRONIC), Vol. 25, Iss. 1, 2018-01 ,pp. : 289-292

John Wiley & Sons Inc

Access to resources Recommend Favorite

X‐ray beam‐shaping via deformable mirrors: surface profile and point spread function computation for Gaussian beams using physical optics

JOURNAL OF SYNCHROTRON RADIATION (ELECTRONIC), Vol. 25, Iss. 1, 2018-01 ,pp. : 123-130

John Wiley & Sons Inc

Access to resources Recommend Favorite