Simultaneous multiplexed materials characterization using a high‐precision hard X‐ray micro‐slit array

E-ISSN： 1600-5775|22|3|653-660

ISSN： 0909-0495

Source： JOURNAL OF SYNCHROTRON RADIATION (ELECTRONIC), Vol.22, Iss.3, 2015-05, pp. : 653-660

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