Effects of self‐seeding and crystal post‐selection on the quality of Monte Carlo‐integrated SFX data

Publisher： John Wiley & Sons Inc

E-ISSN： 1600-5775|22|3|644-652

ISSN： 0909-0495

Source： JOURNAL OF SYNCHROTRON RADIATION (ELECTRONIC), Vol.22, Iss.3, 2015-05, pp. : 644-652

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