Publication series :IEEE Press Series on Microelectronic Systems
Author: Seiichi Aritome
Publisher: John Wiley & Sons Inc
Publication year: 2015
E-ISBN: 9781119132622
P-ISBN(Paperback): 9781119132639
P-ISBN(Hardback): 9781119132608
Subject: TP333 存贮器
Language: ENG
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Description
- Offers a comprehensive overview of NAND flash memories, with insights into NAND history, technology, challenges, evolutions, and perspectives
- Describes new program disturb issues, data retention, power consumption, and possible solutions for the challenges of 3D NAND flash memory
- Written by an authority in NAND flash memory technology, with over 25 years’ experience