Correction and interpretation of Fourier coefficients of X‐ray diffraction patterns from very small, distorted crystals

Publisher: John Wiley & Sons Inc

E-ISSN: 0365-110x|13|10|767-769

ISSN: 0365-110x

Source: Acta Crystallographica, Vol.13, Iss.10, 1960-10, pp. : 767-769

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next