Uncertainties in crystal size computed from the standard deviation of the X‐ray line breadth

Publisher: John Wiley & Sons Inc

E-ISSN: 0365-110x|21|3|433-434

ISSN: 0365-110x

Source: Acta Crystallographica, Vol.21, Iss.3, 1966-09, pp. : 433-434

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next