Mathematical and Physical Aspects of Experimental Investigations on Electron and Relaxation Time Spectra in Bulk and Nano-Structured Semiconductors and Insulators ( Physics Research and Technology )

Publication series : Physics Research and Technology

Author: Valeri Ligatchev  

Publisher: Nova Science Publishers, Inc.‎

Publication year: 2017

E-ISBN: 9781536125863

P-ISBN(Paperback): 9781536125665

Subject: N0 Theory and Methodology of Natural Science

Keyword: 自然科学理论与方法论

Language: ENG

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Mathematical and Physical Aspects of Experimental Investigations on Electron and Relaxation Time Spectra in Bulk and Nano-Structured Semiconductors and Insulators

Chapter

2(c). Space-Charge-Limited-Current (SCLC) Method

2(d). Deep-Level-Transient-Spectroscopy (DLTS)

2(e). Thermostimulated Current (TSC) Method

2(f). Constant Photocurrent Method (CPM)

2(g). Photothermal Deflection Spectroscopy (PDS)

2(h). Admittance Spectroscopy (AS)

2(i). Time-of-Flight (ToF) Technique

Chapter 3

Polarization and Relaxation Processes in Electron States Spectroscopy

3.(a) Orientational Polarization and Relaxation: Basic Ideas and Equations

3.(b) Quantum Mechanical Approach to Electronic Polarization and Relaxation

Chapter 4

One-Dimensional Integral Transforms and Equations

4. (a) One-Dimensional Fourier, Laplace, Mellin, Hilbert and Hankel Integral Transforms

4.(b) Linear Fredholm and Volterra Integral Equation of the First and Second Kinds

4.(c) Fractional Integrals and Derivatives of Fractional Order

Chapter 5

‘Ill-Posed’ Problems and Tikhonov’s ‘Regularization’ Concept

5.(a) Hadamard’s Definition of Well-posed Mathematical Problem

5.(b) Experimental Errors and Stability of Wanted Function

5.(c) Integral Equations with Experimentally Evaluated Left Part: Use of Statistical Information

5.(d) Simulation Technique versus ‘Regularization’ Approach

5.(e) Operator Formalism for ‘Ill-Posed’ Problems

5.(f) Integral – Transform – Based ‘Filtration’ Approach

5.(g) Mathematical Aspects of Computerized Tomography

Chapter 6

Practical Examples of ‘Regularization’ Algorithms

6.(a) Volterra Integral Equation in S-CPM Spectroscopy

6.(b) N(E) Spectra Deconvolution from the CBCM Data Analysis

6.(c) Deconvolution of Relaxation Time Spectra from Admittance Spectroscopy Data

6.(d) C-DLTS Data Analysis

6.(e) Isothermal DLTS Data Analysis

Chapter 7

Results of Implementation of ‘Regularization’ Algorithms

7.(a) Investigation on Deep Defect States Using CPM Technique

7.(b) Relaxation Time Spectrum in Spatially Non-Homogeneous a-Si:H Films

7.(c) Results of Experimental Studies of Semiconducting and Insulating Materials with C-DLTS Technique

Chapter 8

Conclusion

References

About the Author

Index

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