Chapter
2(c). Space-Charge-Limited-Current (SCLC) Method
2(d). Deep-Level-Transient-Spectroscopy (DLTS)
2(e). Thermostimulated Current (TSC) Method
2(f). Constant Photocurrent Method (CPM)
2(g). Photothermal Deflection Spectroscopy (PDS)
2(h). Admittance Spectroscopy (AS)
2(i). Time-of-Flight (ToF) Technique
Polarization and Relaxation Processes in Electron States Spectroscopy
3.(a) Orientational Polarization and Relaxation: Basic Ideas and Equations
3.(b) Quantum Mechanical Approach to Electronic Polarization and Relaxation
One-Dimensional Integral Transforms and Equations
4. (a) One-Dimensional Fourier, Laplace, Mellin, Hilbert and Hankel Integral Transforms
4.(b) Linear Fredholm and Volterra Integral Equation of the First and Second Kinds
4.(c) Fractional Integrals and Derivatives of Fractional Order
‘Ill-Posed’ Problems and Tikhonov’s ‘Regularization’ Concept
5.(a) Hadamard’s Definition of Well-posed Mathematical Problem
5.(b) Experimental Errors and Stability of Wanted Function
5.(c) Integral Equations with Experimentally Evaluated Left Part: Use of Statistical Information
5.(d) Simulation Technique versus ‘Regularization’ Approach
5.(e) Operator Formalism for ‘Ill-Posed’ Problems
5.(f) Integral – Transform – Based ‘Filtration’ Approach
5.(g) Mathematical Aspects of Computerized Tomography
Practical Examples of ‘Regularization’ Algorithms
6.(a) Volterra Integral Equation in S-CPM Spectroscopy
6.(b) N(E) Spectra Deconvolution from the CBCM Data Analysis
6.(c) Deconvolution of Relaxation Time Spectra from Admittance Spectroscopy Data
6.(d) C-DLTS Data Analysis
6.(e) Isothermal DLTS Data Analysis
Results of Implementation of ‘Regularization’ Algorithms
7.(a) Investigation on Deep Defect States Using CPM Technique
7.(b) Relaxation Time Spectrum in Spatially Non-Homogeneous a-Si:H Films
7.(c) Results of Experimental Studies of Semiconducting and Insulating Materials with C-DLTS Technique