Reliability of Yield Models of Defoliated Soybean Based on Leaf Area Index Versus Leaf Area Removed

Author： KLUBERTANZ T. H. PEDICO L. P. CARLSON R. E.

Publisher： Entomological Society of America

ISSN： 1938-291X

Source： Journal of Economic Entomology, Vol.89, Iss.3, 1996-06, pp. : 751-756

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