Uncertainties in the permittivity of thin films extracted from measurements with near field microwave microscopy calibrated by an image charge model

Author： Barker D J Jackson T J Suherman P M Gashinova M S Lancaster M J

Publisher： IOP Publishing

ISSN： 0957-0233

Source： Measurement Science and Technology, Vol.25, Iss.10, 2014-10, pp. : 105601-105610

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