Author: Kozlov K. Baumann P. Waldmann J. Samsonova M.
Publisher: MAIK Nauka/Interperiodica
ISSN: 1054-6618
Source: Pattern Recognition and Image Analysis, Vol.23, Iss.4, 2013-10, pp. : 488-497
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Related content
Spot intensity processing in LEED images
By Roucka R. Jiruse J. Sikola T.
Vacuum, Vol. 65, Iss. 2, 2002-04 ,pp. :