Analysis of cross-correlation of interface roughness in multilayer structures with ultrashort periods

Author： Vainer Yu.   Pestov A.   Prokhorov K.   Salashchenko N.   Fraerman A.   Chernov V.   Chkhalo N.  

Publisher： MAIK Nauka/Interperiodica

ISSN： 1063-7761

Source： Journal of Experimental and Theoretical Physics, Vol.103, Iss.3, 2006-09, pp. : 346-353

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