Author: Bairamov F. Toporov V. Poloskin E. Bairamov H. Röder C. Sprung C. Bohmhammel K. Seidel J. Irmer G. Lashkul A. Lähderanta E. Song Y.
Publisher: MAIK Nauka/Interperiodica
ISSN: 1063-7826
Source: Semiconductors, Vol.47, Iss.5, 2013-05, pp. : 623-627
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