Investigation of the chemical state of copper in Cu/SiO2 composite films by x-ray photoelectron spectroscopy

Author: Gurevich S.   Zaraiskaya T.   Konnikov S.   Mikushkin V.   Nikonov S.   Sitnikova A.   Sysoev S.   Khorenko V.   Shnitov V.   Gordeev Yu.  

Publisher: MAIK Nauka/Interperiodica

ISSN: 1063-7834

Source: Physics of the Solid State, Vol.39, Iss.10, 1997-10, pp. : 1691-1695

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