Raman scattering spectra and electrical conductivity of thin silicon films with a mixed amorphous-nanocrystalline phase composition: Determination of the nanocrystalline volume fraction

Author： Golubev V.   Davydov V.   Medvedev A.   Pevtsov A.   Feoktistov N.  

Publisher： MAIK Nauka/Interperiodica

ISSN： 1063-7834

Source： Physics of the Solid State, Vol.39, Iss.8, 1997-08, pp. : 1197-1201

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