Effect of surface segregation on the sharpness of heteroboundaries in multilayered Si(Ge)/Si1−x Gex structures grown from atomic beams in vacuum
Publisher: MAIK Nauka/Interperiodica
ISSN: 1063-7834
Source: Physics of the Solid State, Vol.43, Iss.6, 2001-06, pp. : 1182-1187
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